The relative success of nanoscale RTD, SET and EQC a devices as replacements for CMOS at the system level

Proceedings of the IEEE Conference on Nanotechnology

Volumn 2001-January, Issue , 2001, Pages 272-276

  Nikolic, K ^a   Forshaw, M ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; NANOTECHNOLOGY; QUANTUM ELECTRONICS; RESONANT TUNNELING; SINGLE ELECTRON TRANSISTORS; TRANSIENTS;

CIRCUIT ARCHITECTURES; CIRCUIT DENSITY; CONVENTIONAL DESIGN; DEVICE TECHNOLOGIES; ELECTRONIC QUANTUM; LOGIC APPLICATIONS; OPERATING SPEED; SINGLE-ELECTRON TUNNELING;

RESONANT TUNNELING DIODES;

EID: 24644516051     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2001.966432     Document Type: Conference Paper

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