SCOPUS 정보 검색 플랫폼

Journal of Alloys and Compounds

Volumn 401, Issue 1-2, 2005, Pages 199-204

Convergent beam electron diffraction investigation of inversion domains in GaN

(1) Ruterana, P a

a UNIVERSITÉ DE CAEN (France)

Author keywords

Defects; Surfaces and interfaces; Thin films GaN; Transmission electron microscopy

Indexed keywords

DEFECTS; ELECTRON BEAMS; ELECTRON DIFFRACTION; GROWTH KINETICS; INTERFACES (MATERIALS); SAPPHIRE; SILICON; SUBSTRATES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

INVERSION DOMAIN BOUNDARIES (IDB); SURFACES AND INTERFACES; THIN FILMS GAN; ZINCBLENDE STRUCTURE;

GALLIUM NITRIDE;

EID: 24644470474 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2004.10.079 Document Type: Article

Times cited : (8)

References (14)

1
- 21544461610
- H. Morkoç, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov, and M. Burns J. Appl. Phys. 76 1994 1363
- (1994) J. Appl. Phys. , vol.76 , pp. 1363
- Morkoç, H.¹ Strite, S.² Gao, G.B.³ Lin, M.E.⁴ Sverdlov, B.⁵ Burns, M.⁶

2
- 0029779805
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto Jpn. J. Appl. Phys. 35 1996 L74
- (1996) Jpn. J. Appl. Phys. , vol.35
- Nakamura, S.¹ Senoh, M.² Nagahama, S.³ Iwasa, N.⁴ Yamada, T.⁵ Matsushita, T.⁶ Kiyoku, H.⁷ Sugimoto, Y.⁸

3
- 0029637531
- S.D. Lester, F.A. Ponce, M.G. Craford, and D.A. Steigerwald Appl. Phys. Lett. 66 1995 1249
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1249
- Lester, S.D.¹ Ponce, F.A.² Craford, M.G.³ Steigerwald, D.A.⁴

4
- 0029727121
- J.L. Rouvière, M. Arlery, A. Bourret, R. Niebuhr, and K. Bachem Mater. Res. Soc. Symp. Proc. 395 1996 393
- (1996) Mater. Res. Soc. Symp. Proc. , vol.395 , pp. 393
- Rouvière, J.L.¹ Arlery, M.² Bourret, A.³ Niebuhr, R.⁴ Bachem, K.⁵

5
- 0001259032
- V. Potin, P. Ruterana, and G. Nouet J. Appl. Phys. 82 1997 2176
- (1997) J. Appl. Phys. , vol.82 , pp. 2176
- Potin, V.¹ Ruterana, P.² Nouet, G.³

6
- 0037707069
- A.M. Sanchez, P. Ruterana, M. Benamara, and H.P. Strunk Appl. Phys. Lett. 82 2003 4471
- (2003) Appl. Phys. Lett. , vol.82 , pp. 4471
- Sanchez, A.M.¹ Ruterana, P.² Benamara, M.³ Strunk, H.P.⁴

7
- 0023162961
- P. Stadelmann Ultramicroscopy 21 1987 131
- (1987) Ultramicroscopy , vol.21 , pp. 131
- Stadelmann, P.¹

8
- 84975376970
- W. Von Müench, and I. Pfaffeneder J. Electrochem. Soc. 122 1975 642
- (1975) J. Electrochem. Soc. , vol.122 , pp. 642
- Von Müench, W.¹ Pfaffeneder, I.²

9
- 0000889426
- J.L. Rouvière, M. Arlery, A. Bourret, R. Niebuhr, K. Bachem, Institute of Physics Conference Series No. 146, 1995, p. 285.
- (1995) Institute of Physics Conference Series No. 146 , vol.146 , pp. 285
- Rouvière, J.L.¹ Arlery, M.² Bourret, A.³ Niebuhr, R.⁴ Bachem, K.⁵

10
- 0040153856
- P. Vermaut, P. Ruterana, G. Nouet, and H. Morkoç Phil. Mag. A 75 1997 239
- (1997) Phil. Mag. A , vol.75 , pp. 239
- Vermaut, P.¹ Ruterana, P.² Nouet, G.³ Morkoç, H.⁴

11
- 0040260989
- P. Vermaut, P. Ruterana, G. Nouet, A. Salvador, and H. Morkoç Mater. Sci. Eng. B 43 1996 279
- (1996) Mater. Sci. Eng. B , vol.43 , pp. 279
- Vermaut, P.¹ Ruterana, P.² Nouet, G.³ Salvador, A.⁴ Morkoç, H.⁵

12
- 0015648586
- R. Serneels, M. Snykers, P. Delavignette, R. Gevers, and S. Amelinckx Phys. Stat. Sol. B 58 1973 277
- (1973) Phys. Stat. Sol. B , vol.58 , pp. 277
- Serneels, R.¹ Snykers, M.² Delavignette, P.³ Gevers, R.⁴ Amelinckx, S.⁵

13
- 0037198536
- A.M. Sánchez, F.J. Pacheco, S.I. Molina, R. García, P. Ruterana, and G. Nouet Mater. Sci. Eng. B 93 2002 181
- (2002) Mater. Sci. Eng. B , vol.93 , pp. 181
- Sánchez, A.M.¹ Pacheco, F.J.² Molina, S.I.³ García, R.⁴ Ruterana, P.⁵ Nouet, G.⁶

14
- 0002570781
- P. Ruterana, B. Barbaray, A. Bere, P. Vermaut, A. Hairie, E. Paumier, G. Nouet, A. Salvador, A. Botchkarev, and H. Morkoc Phys. Rev. 59 1999 15917
- (1999) Phys. Rev. , vol.59 , pp. 15917
- Ruterana, P.¹ Barbaray, B.² Bere, A.³ Vermaut, P.⁴ Hairie, A.⁵ Paumier, E.⁶ Nouet, G.⁷ Salvador, A.⁸ Botchkarev, A.⁹ Morkoc, H.¹⁰

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.