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Volumn 19, Issue 1, 2005, Pages 56-65

Cold atoms close to surfaces: Measuring magnetic field roughness and disorder potentials

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EID: 24644463388     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/19/1/009     Document Type: Conference Paper
Times cited : (17)

References (44)
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    • Krüger P, et al 2005 ArXiv Preprint cond-mat/0504686
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    • note
    • This fabrication method [17] was used for the chip in all our previous experiments [7, 8, 10].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.