Electronic properties of the organic semiconductor hetero-interface CuPc/C 60

Applied Surface Science

Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 143-147

  Molodtsova, O V ^a   Schwieger, T ^a   Knupfer, M ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Copper phthalocyanine; Energy level alignment; Fullerite; Kelvin probe method; Organic organic interface; Photoelectron spectroscopy; Work function

Indexed keywords

BENDING (DEFORMATION); COPPER COMPOUNDS; ELECTRON ENERGY LEVELS; ELECTRONIC PROPERTIES; FULLERENES; ORGANIC COMPOUNDS; PHOTOELECTRON SPECTROSCOPY;

COPPER PHTHALOCYANINE; ENERGY LEVEL ALIGNMENT; FULLERITE; KELVIN-PROBE METHOD; ORGANIC-ORGANIC INTERFACE; WORK FUNCTIONS;

SEMICONDUCTOR MATERIALS;

EID: 24644458730     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.023     Document Type: Conference Paper

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