Electronic charge distribution at interfaces between Cu-phthalocyanine films and semiconductor surfaces

Surface Science

Volumn 532-535, Issue , 2003, Pages 1004-1010

  Komolov, A S ^a,b   Moller P J ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

Electron solid scattering and transmission elastic; Semiconductor semiconductor interfaces; Silicon; Silicon oxides; Surface chemical reaction; Surface electronic phenomena (work function, surface potential, surface states, etc.); Zinc oxide

Indexed keywords

CHARGE TRANSFER; COPPER; CRYSTALLINE MATERIALS; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; GAS ADSORPTION; INTERFACES (MATERIALS); OXIDATION; SEMICONDUCTOR MATERIALS; SURFACE REACTIONS;

ELECTRONIC CHARGE DISTRIBUTION;

SURFACES;

EID: 0038182983     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00459-X     Document Type: Conference Paper

References (27)

1. McKeown N.B. Phthalocyanine materials: synthesis, structure and function. 1998;Cambridge University Press, Cambridge.
2. Lee S.T., Wang Y.M., Hou X.Y., Tang C.W. Appl. Phys. Lett. 74(5):1999;670.
3. Wright J.D. Progr. Surf. Sci. 31:1989;1.
4. Evans D.A., Steiner J., Middlerton R.et al. Appl. Surf. Sci. 175-176:2001;374.
5. Chassé T., Wu C.I., Hill I.G., Kahn A. J. Appl. Phys. 85(9):1999;6589.
6. Ishii H., Sugiyama K., Ito E., Seki K. Adv. Mater. 11(8):1999;605.
7. Hill I.G., Schwartz J., Kahn A. Organic Electr. 1:2000;5.
8. Shimada T., Hamaguchi K., Ohuchi F.S. Appl. Phys. Lett. 72(15):1998;1869.
9. Lozzi L., Ottaviano L., Santucci S. Surf. Sci. 470:2001;265.
10. Parthasarathy G., Burrows P.E., Khalfin V.et al. Appl. Phys. Lett. 72:1998;2138.
11. Komolov A.S., Schaumburg K. Synth. Met. 113:2000;217.
12. Oji H., Mitsumoto R., Ito E.et al. J. Chem. Phys. 109(23):1998;10409.
13. Komolov S.A. Total current spectroscopy of surfaces. 1992;Gordon & Breach, Philadelphia.
14. Komolov S.A., Lazneva E.F., Møller P.J. J. Phys.: Condens. Mat. 9:1997;7297.
15. Komolov S.A., Gerasimova N., Sidorenko A. Phys. Low-Dim. Struct. 3/4:1999;91.
16. Schäfer I., Schlüter M., Skibowski M. Phys. Rev. B. 35(14):1987;7663.
17. Seah M.P., Dench W.A. Surf. Interface Anal. 1:1979;2.
18. Taborski J., Vaterlein P., Zimmermann U., Umbach E. J. Electron Spectr. Rel. Phen. 75:1995;129.
19. Komolov A.S., Møller P.J. Synth. Met. 123:2001;359.
20. Rocco M., Frank K., Yannoulis P., Koch E. J. Chem. Phys. 93(9):1990;6859.
21. Hill I.G., Kahn A., Soos Z.G.et al. Chem. Phys. Lett. 327:2000;181.
22. Schäffer A.M., Goutterman M., Davidson E.R. Theoret. Chim. Acta. 30:1973;9.
23. Kutzler F.W., Ellis D.E. J. Chem. Phys. 84:1986;1033.
24. Szuber J. J. Electron Spectr. Rel. Phen. 63:1993;R1.
25. Chen J.G. Surf. Sci. Rep. 30(1-3):1997;1.
26. Szczepaniak B., Bragiel P. Vacuum. 46(5/6):1995;465.
27. Jivkov I., Nedkov T., Nespurek S.et al. Vacuum. 58:2000;340.