Kelvin probe investigations of metal work functions and correlation to device performance of organic light-emitting devices

Synthetic Metals

Volumn 111, Issue , 2000, Pages 295-297

  Beierlein, T A ^a   Brutting W ^b   Riel, H ^a   Haskal, E I ^a   Muller P ^a   Riess W ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BINDING ENERGY; CHARGE CARRIERS; COPPER COMPOUNDS; ELECTRODES; INDIUM COMPOUNDS; MULTILAYERS; PLASMAS; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE ROUGHNESS; SURFACE TREATMENT; ULTRAVIOLET RADIATION;

CONTACT POTENTIAL DIFFERENCE; COPPER-PHTHALOCYANINE; DINAPHTHALEN DIPHENYL BENZIDINE; KELVIN PROBE; ORGANIC LIGHT EMITTING DEVICES; TRISHYDROXYQUINOLINATION ALUMINUM;

LIGHT EMITTING DIODES;

EID: 2542510338     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00450-6     Document Type: Article

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