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Volumn 1, Issue , 2005, Pages 30-37

Comparison of substrate finishes for flip chip packages

Author keywords

[No Author keywords available]

Indexed keywords

ENIG; FLIP CHIP PACKAGES; MECHANICAL SHOCKS; SURFACE FINISH;

EID: 24644450786     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (16)
  • 1
    • 0003304960 scopus 로고    scopus 로고
    • A root cause failure mechanism for solder joint integrity of electroless Nickel/immersion gold surface finishes
    • Paper no. S18-5, March 14-18
    • Nicholas Biunno, "A Root Cause Failure Mechanism for Solder Joint Integrity of Electroless Nickel/Immersion Gold Surface Finishes," Proc. IPC Printed Circuits Expo1999, Paper no. S18-5, March 14-18, 1999.
    • (1999) Proc. IPC Printed Circuits Expo1999
    • Biunno, N.1
  • 5
    • 0009616246 scopus 로고    scopus 로고
    • Are you in control of your electroless Nickel/immersion gold process?
    • Miami, Fl, Sept.
    • K. Johal and J. Brewer, "Are you in Control of your Electroless Nickel/Immersion Gold Process?", Proc. Of IPC Works, No. S03-3, Miami, Fl, Sept. 2000.
    • (2000) Proc. of IPC Works , vol.S03-3
    • Johal, K.1    Brewer, J.2
  • 6
    • 24644507164 scopus 로고    scopus 로고
    • Flexure induced failure of BGA solder joints
    • Sept.
    • K. Lei, J. LLinas, and M. Gwaltney, "Flexure induced failure of BGA solder joints", Proc. Of SMTAI, Sept. 1999.
    • (1999) Proc. of SMTAI
    • Lei, K.1    Llinas, J.2    Gwaltney, M.3
  • 7
    • 0001958112 scopus 로고    scopus 로고
    • Reliability performance and failure mode of high I/O thermally enhanced ball grid array packages
    • Austin, TX, October 19-21
    • R. J. Coyle, T. I. Ejim, A. Holliday, P. P.Solan, and J. K. Dorey, "Reliability Performance and Failure Mode of High I/O Thermally Enhanced Ball Grid Array Packages," Proc. 23th IEMT, Austin, TX, 323-332, October 19-21, 1998.
    • (1998) Proc. 23th IEMT , pp. 323-332
    • Coyle, R.J.1    Ejim, T.I.2    Holliday, A.3    Solan, P.P.4    Dorey, J.K.5
  • 10
  • 12
    • 24644464733 scopus 로고    scopus 로고
    • Characterization of PWB flexural loading using strain gages
    • San Jose, CA, March
    • K. Newman, "Characterization of PWB Flexural Loading Using Strain Gages", Presented at Sun Microsystems Strain Gage Test Summit, San Jose, CA, March 2004.
    • (2004) Sun Microsystems Strain Gage Test Summit
    • Newman, K.1
  • 16
    • 84861245914 scopus 로고    scopus 로고
    • Patent "Method for measuring interconnect and board level reliability using a Programmable Logic Device"
    • R. Wu, J. Barton, B., Euzent, A. Pannikkat, T. Jonsson, V. Mahadev, Patent "Method for measuring interconnect and board level reliability using a Programmable Logic Device"
    • Wu, R.1    Barton, J.2    Euzent, B.3    Pannikkat, A.4    Jonsson, T.5    Mahadev, V.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.