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Surface and Coatings Technology

Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 170-173

X-ray diffraction analysis of residual stresses in smooth fined-grain diamond coatings deposited on TA6V alloys

(7) Goudeau, P a Vandenbulcke, L b Met, C b De Barros, M I c AndreAzza, P d Thiaudiere, D e Gailhanou, M f

a UNIVERSITÉ DE POITIERS (France)

b CNRS (France)

c ECOLE CENTRALE DE LYON (France)

d CRMD CNRS (France)

e SYNCHROTRON SOLEIL (France)

f AIX MARSEILLE UNIVERSITY (France)

Author keywords

B Elastic properties; B X ray diffraction; D Diamond; D nanostructure; D Titanium alloy; X Residual stresses

Indexed keywords

BRILLOUIN SCATTERING; CHEMICAL VAPOR DEPOSITION; DIAMOND FILMS; ELASTIC MODULI; ELASTICITY; NANOSTRUCTURED MATERIALS; RESIDUAL STRESSES; STRESS ANALYSIS; TITANIUM ALLOYS; X RAY DIFFRACTION ANALYSIS;

DIAMOND COATINGS; ELASTIC PROPERTIES;

PROTECTIVE COATINGS;

X-RAY;

EID: 24644446917 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.02.082 Document Type: Article

Times cited : (6)

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