Nondestructive evaluation of micrometric diamond films with an interferometric picosecond ultrasonics technique

Journal of Applied Physics

Volumn 95, Issue 8, 2004, Pages 4157-4162

  Rossignol, C ^a,d   Perrin, B ^a   Laborde, S ^a   Vandenbulcke, L ^b   De Barros, M I ^b   Djemia, P ^c  

^a CNRS   (France)

^b UNIVERSITÉ D'ORLÉANS   (France)

^c UNIVERSITÉ PARIS 13   (France)

^d University Bordeaux I2M UMR CNRS 5295   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; ELECTRIC CONDUCTIVITY; FRICTION; LASER PULSES; LIGHT PROPAGATION; LIGHT REFLECTION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THERMAL CONDUCTIVITY; THIN FILMS; ULTRASONICS;

DISPLACEMENT; MICROMETRIC DIAMOND FILMS; MULTILAYER NANOMETRIC STRUCTURE; OPTICAL TRANSIENT REFLECTIVITY;

DIAMOND FILMS;

EID: 2342586190     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1687049     Document Type: Article

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