|
Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 241-244
|
Growth mechanism for chromium nitride films deposited by magnetron and triode sputtering methods
|
Author keywords
Chromium nitride; PVD coatings; Stress; X ray diffraction
|
Indexed keywords
FILM GROWTH;
INORGANIC COATINGS;
MAGNETRON SPUTTERING;
MATHEMATICAL MODELS;
PHYSICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SPUTTER DEPOSITION;
STRESS ANALYSIS;
STRUCTURE (COMPOSITION);
X RAY DIFFRACTION ANALYSIS;
CHROMIUM NITRIDE;
GROWTH MECHANISM;
INTRINSIC STRESS;
PHYSICAL VAPOR DEPOSITION COATINGS;
STRESS MEASUREMENTS;
TRIODE SPUTTERING;
CHROMIUM COMPOUNDS;
COATING;
|
EID: 24644443777
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.02.062 Document Type: Article |
Times cited : (26)
|
References (13)
|