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Volumn 18, Issue 1, 2000, Pages 121-130
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Microstructural evolution during tempering of arc-evaporated Cr-N coatings
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AUGER ELECTRON SPECTROSCOPY;
CHROMIUM COMPOUNDS;
CRYSTAL DEFECTS;
CRYSTAL MICROSTRUCTURE;
EVAPORATION;
PHASE TRANSITIONS;
TEMPERING;
THERMAL EFFECTS;
THERMODYNAMIC STABILITY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
DEFECT RELAXATION;
LATTICE DEFECT DENSITY;
THIN CERAMIC COATINGS;
VACUUM DEPOSITED COATINGS;
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EID: 0033715127
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.582128 Document Type: Article |
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Times cited : (59)
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References (2)
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