Possibility of measuring exchange force through force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 366-370

  Nakamura, K ^a   Oguchi, T ^b   Hasegawa, H ^c   Sueoka, K ^a   Hayakawa, K ^a   Mukasa, K ^a,d  

^a HOKKAIDO UNIVERSITY   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c TOKYO GAKUGEI UNIVERSITY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

07.79.Lh; 73.20. r; 75.30.Pd; APN; Atomic force microscopy; Exchange force; Exchange force microscopy; First principles calculation; Surface magnetic structure

Indexed keywords

EID: 0038547309     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00556-X     Document Type: Article

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