Calibration of rent's rule models for three-dimensional integrated circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 4, 2004, Pages 359-366

  Das, Shamik ^a   Chandrakasan, Anantha P ^a   Reif, Rafael ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Rent's Rule; System level interconnect prediction (SLIP); Three dimensional (3 D) integration

Indexed keywords

ASPECT RATIO; BONDING; ELECTRIC WIRE; EPITAXIAL GROWTH; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SILICON WAFERS; TRANSISTORS;

CHIP DIMENSIONS; RENT'S RULE; SYSTEM LEVEL INTERCONNECT PREDICTION (SLIP); THREE DIMENSIONAL (3-D) INTEGRATION;

INTEGRATED CIRCUITS;

EID: 2442685836     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.825833     Document Type: Conference Paper

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