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Volumn 25, Issue 5, 2004, Pages 331-333

Using direct-tunneling mechanism to suppress hysteresis effect in floating-body partially depleted SOI devices

Author keywords

Direct tunneling; Floating body; Hysteresis; Partially depleted silicon on insulator (PD SOI)

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON TUNNELING; GATES (TRANSISTOR); HYSTERESIS; SILICON ON INSULATOR TECHNOLOGY;

EID: 2442591792     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2004.827284     Document Type: Letter
Times cited : (4)

References (7)
  • 1
    • 0000036097 scopus 로고    scopus 로고
    • Hysteresis effect in pass-transistor-based, partially depleted SOI CMOS circuits
    • Apr.
    • R. Puri and C.-T. Chuang, "Hysteresis effect in pass-transistor-based, partially depleted SOI CMOS circuits," IEEE J. Solid-State Circuits, vol. 35, pp. 625-631, Apr. 2000.
    • (2000) IEEE J. Solid-State Circuits , vol.35 , pp. 625-631
    • Puri, R.1    Chuang, C.-T.2
  • 4
    • 0035395857 scopus 로고    scopus 로고
    • Modeling CMOS tunneling currents through ultrathin gate oxide due to conduction- and valence-band electron and hole tunneling
    • July
    • W. C. Lee and C. Hu, "Modeling CMOS tunneling currents through ultrathin gate oxide due to conduction- and valence-band electron and hole tunneling," IEEE Trans. Electron Devices, vol. 48, pp. 1366-1373, July 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 1366-1373
    • Lee, W.C.1    Hu, C.2
  • 5
    • 0041441251 scopus 로고    scopus 로고
    • Linear kink effect' induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETs
    • July
    • A. Mercha, J. M. Rafi, E. Simoen, E. Augendre, and C. Claeys, "Linear kink effect' induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETs," IEEE Trans. Electron Devices, vol. 50, pp. 1675-1682, July 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , pp. 1675-1682
    • Mercha, A.1    Rafi, J.M.2    Simoen, E.3    Augendre, E.4    Claeys, C.5
  • 7
    • 33646864552 scopus 로고    scopus 로고
    • Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
    • Feb.
    • K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand, "Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits," Proc. IEEE, vol. 91, pp. 305-327, Feb. 2003.
    • (2003) Proc. IEEE , vol.91 , pp. 305-327
    • Roy, K.1    Mukhopadhyay, S.2    Mahmoodi-Meimand, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.