Magnetic tunnel junctions - Principles and applications

Vacuum

Volumn 74, Issue 3-4 SPEC. ISS., 2004, Pages 705-709

  Samant, Mahesh G ^a   Parkin, Stuart S P ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

MRAM; MTJ; Structure of copper interface layer

Indexed keywords

ATOMIC FORCE MICROSCOPY; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HARD DISK STORAGE; MAGNETIC MOMENTS; MAGNETISM; RANDOM ACCESS STORAGE; SENSORS; ULTRATHIN FILMS;

FLASH MEMORIES; MAGNETIC TUNNEL JUNCTIONS (MTJ);

TUNNEL JUNCTIONS;

EID: 2442425999     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.01.053     Document Type: Article

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