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Volumn 85, Issue 8 II A, 1999, Pages 5264-5266
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Dependence of tunneling magnetoresistance on ferromagnetic electrode thickness and on the thickness of a Cu layer inserted at the Al2O3/CoFe interface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000246691
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.369849 Document Type: Article |
Times cited : (61)
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References (14)
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