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Volumn 85, Issue 8 II A, 1999, Pages 5264-5266

Dependence of tunneling magnetoresistance on ferromagnetic electrode thickness and on the thickness of a Cu layer inserted at the Al2O3/CoFe interface

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[No Author keywords available]

Indexed keywords


EID: 0000246691     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369849     Document Type: Article
Times cited : (61)

References (14)
  • 3
    • 0346640662 scopus 로고    scopus 로고
    • J. S. Moodera, L. R. Kinder, T. M. Wong, and R. Meservey, Phys. Rev. Lett. 74, 3273 (1995); J. S. Moodera and L. R. Kinder, J. Appl. Phys. 79, 4724 (1996).
    • (1996) J. Appl. Phys. , vol.79 , pp. 4724
    • Moodera, J.S.1    Kinder, L.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.