메뉴 건너뛰기




Volumn 9, Issue , 2004, Pages 272-281

Void free processing of flip chip on board assemblies using no-flow underfills

Author keywords

Area array; Electronics packaging; Flip chip; No flow underfill; Process optimization; Void free

Indexed keywords

AREA ARRAY; NO FILL UNDERFILL; PROCESS OPTIMIZATION; VOID FREE;

EID: 2442419974     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (12)
  • 2
    • 0032688676 scopus 로고    scopus 로고
    • High throughput flip chip processing and reliability analysis using no-flow underfills
    • Ph.D.
    • Ryan Thorpe and Daniel Baldwin Ph.D., "High Throughput Flip Chip Processing and Reliability Analysis Using No-Flow Underfills", Electronic Components and Technology Conference, 1999
    • (1999) Electronic Components and Technology Conference
    • Thorpe, R.1    Baldwin, D.2
  • 3
    • 2442768982 scopus 로고    scopus 로고
    • Reflowable material systems to integrate the reflow and encapsulant dispensing process for flip chip on board assemblies
    • Atlanta, GA
    • D. Gamota and C. Melton, "Reflowable material systems to integrate the reflow and encapsulant dispensing process for flip chip on board assemblies", Proc. Int. Conf. Electron. Assent. Mater., Atlanta, GA, 1996.
    • (1996) Proc. Int. Conf. Electron. Assent. Mater.
    • Gamota, D.1    Melton, C.2
  • 4
    • 0031653238 scopus 로고    scopus 로고
    • Materials to integrate the solder reflow and underfill encapsulation process for flip chip on board assembly
    • Jan.
    • D. Gamota and C. Melton, "Materials to integrate the solder reflow and underfill encapsulation process for flip chip on board assembly", IEEE Trans. Comp., Packag., Manufact. Technol. C, Vol. 21, pp. 57-65, Jan. 1998.
    • (1998) IEEE Trans. Comp., Packag., Manufact. Technol. C , vol.21 , pp. 57-65
    • Gamota, D.1    Melton, C.2
  • 5
    • 0035301154 scopus 로고    scopus 로고
    • Yield analysis and process modeling of low cost, high throughput flip chip assembly based on no-flow underfills
    • April
    • Ryan Thorpe, Daniel F. Baldwin, Brian Smith, and Lawrence McGovern, "Yield Analysis and Process Modeling of Low Cost, High Throughput Flip Chip Assembly Based on No-Flow Underfills" IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 2, April 2001
    • (2001) IEEE Transactions on Electronics Packaging Manufacturing , vol.24 , Issue.2
    • Thorpe, R.1    Baldwin, D.F.2    Smith, B.3    McGovern, L.4
  • 7
    • 0034482527 scopus 로고    scopus 로고
    • Experimental and numerical reliability investigations of FCOB assemblies with process-induced defects
    • A. Shubert, et al., "Experimental and Numerical Reliability Investigations of FCOB Assemblies with Process-induced Defects", Electronic Components and Technology Conference, 2000, pp. 624-632
    • (2000) Electronic Components and Technology Conference , pp. 624-632
    • Shubert, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.