Bifurcations and fundamental error bounds for fault-tolerant computations

IEEE Transactions on Nanotechnology

Volumn 4, Issue 4, 2005, Pages 395-402

  Gao, J B ^a   Qi, Yan ^a,b   Fortes, José A B ^a  

^a University of Florida   (United States)

^b Johns Hopkins University   (United States)

Author keywords

Bifurcation; Error threshold; Noisy NAND gate; Probabilistic reliable computation

Indexed keywords

BIFURCATION (MATHEMATICS); ERROR ANALYSIS; LOGIC GATES; PROBABILITY; RELIABILITY;

BIFURCATION ANALYSIS; ERROR THRESHOLD; NOISY NAND GATE; PROBABILISTIC/RELIABLE COMPUTATION;

NANOTECHNOLOGY;

EID: 24344473023     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2005.851289     Document Type: Article

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