Scanning probe microscopy with quartz crystal cantilever

Applied Physics Letters

Volumn 87, Issue 7, 2005, Pages

  Ono, Takahito ^a   Lin, Yu Ching ^a   Esashi, Masayoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT ATMOSPHERE; PIEZOELECTRIC VIBRATION SENSING; QUARTZ CRYSTALS; SCANNING PROBE MICROSCOPY (SPM);

CRYSTALS; ELECTROMECHANICAL DEVICES; IMAGING TECHNIQUES; PIEZOELECTRICITY; QUARTZ; SCANNING; SENSITIVITY ANALYSIS; TEMPERATURE MEASUREMENT; VIBRATION CONTROL;

MICROSCOPIC EXAMINATION;

EID: 24144485430     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2031937     Document Type: Article

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