Scanned probe microscopy at millikelvin temperatures

Physica B: Condensed Matter

Volumn 280, Issue 1-4, 2000, Pages 546-550

  Nunes Jr , G ^a  

^a Dartmouth College   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; ELECTRON TUNNELING; LOW TEMPERATURE OPERATIONS; MAGNETIC FIELDS;

MILLIKELVIN FORCE MICROSCOPE; SCANNED PROBE MICROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 0033890856     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01859-1     Document Type: Article

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