Significant stiffness reduction at ferroelectric domain boundary evaluated by ultrasonic atomic force microscopy

Applied Physics Letters

Volumn 87, Issue 7, 2005, Pages

  Tsuji, T ^a   Saito, S ^a   Fukuda, K ^a   Yamanaka, K ^a   Ogiso, H ^b   Akedo, J ^b   Kawakami, Y ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c NEC TOKIN CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN BOUNDARY; FREQUENCY MAPPING; NANOSCALE; RESONANT FREQUENCY;

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; LEAD COMPOUNDS; MAGNETIC DOMAINS; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY; STIFFNESS; ULTRASONICS;

FERROELECTRIC MATERIALS;

EID: 24144469784     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2012537     Document Type: Article

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