Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy

Applied Physics Letters

Volumn 83, Issue 13, 2003, Pages 2650-2652

  Matsuura, K ^a   Cho, Y ^a   Ramesh, R ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LEAD COMPOUNDS; MICROSCOPIC EXAMINATION; PERMITTIVITY; SCANNING;

DOMAIN WALLS;

THIN FILMS;

EID: 0142025303     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1609252     Document Type: Article

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