Integrity profiling of high throughput screening hits using LC-MS and related techniques

Combinatorial Chemistry and High Throughput Screening

Volumn 8, Issue 6, 2005, Pages 459-466

  Kerns, Edward H ^a   Di, Li ^a   Bourassa, Jim ^a   Gross, Jonathan ^a   Huang, Nelson ^a   Liu, Hanlan ^b   Kleintop, Teresa ^a   Nogle, Lisa ^a   Mallis, Larry ^a   Petucci, Chris ^a   Petusky, Susan ^a   Tischler, Mark ^b   Sabus, Chantel ^b   Sarkahian, Ani ^a   Young, Mairead ^b   Zhang, Mei Yi ^a   Huryn, Donna ^a   McConnell, Oliver ^a   Carter, Guy ^b  

^a PFIZER INC   (United States)

^b WYETH RESEARCH   (United States)

Author keywords

Chemiluminescent nitrogen detection (CLND); Evaporative light scattering detection (ELSD); Integrity profiling; LC MS

Indexed keywords

DIMETHYL SULFOXIDE; INORGANIC SALT; PLASTIC; SILICON DIOXIDE; SOLVENT; TRIFLUOROACETIC ACID;

ANALYTICAL ERROR; ELECTROSPRAY; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; HIGH THROUGHPUT SCREENING; ION MONITORING; LIQUID CHROMATOGRAPHY; MASS SPECTROMETRY; MOLECULAR WEIGHT; NUCLEAR MAGNETIC RESONANCE; PHASE SEPARATION; PRIORITY JOURNAL; REVIEW; STRUCTURE ACTIVITY RELATION; ULTRAVIOLET RADIATION;

CHROMATOGRAPHY, LIQUID; COMBINATORIAL CHEMISTRY TECHNIQUES; MASS SPECTROMETRY; SCATTERING, RADIATION; SPECTROPHOTOMETRY, ULTRAVIOLET; STRUCTURE-ACTIVITY RELATIONSHIP;

EID: 24144432074     PISSN: 13862073     EISSN: None     Source Type: Journal    
DOI: 10.2174/1386207054867283     Document Type: Review

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