(EDT-TTF-CONH2)6[Re6Se8(CN) 6], a metallic Kagome-type organic-inorganic hybrid compound: Electronic instability, molecular motion, and charge localization

Journal of the American Chemical Society

Volumn 127, Issue 33, 2005, Pages 11785-11797

  Baudron, Stéphane A ^a   Batail, Patrick ^a   Coulon, Claude ^b   Clérac, Rodolphe ^b   Canadell, Enric ^c   Laukhin, Vladimir ^c,d   Melzi, Roberto ^e   Wzietek, Pawel ^e   Jérome, Denis ^e   Auban Senzier, Pascale ^e   Ravy, Sylvain ^e  

^a UNIVERSITÉ D'ANGERS   (France)

^b CENTRE DE RECHERCHE PAUL PASCAL   (France)

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^d INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

^e UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEXATION; CRYOGENICS; ELECTRON SPECTROSCOPY; HYDROGEN BONDS; NITROGEN COMPOUNDS; TOPOLOGY;

BOND ACCEPTORS; KAGOME TOPOLOGY; ROOM TEMPERATURE; SPACE GROUP;

OLEFINS;

CYANIC ACID DERIVATIVE; ETHYLENEDITHIOTETRATHIAFULVALENE; FULVALENE DERIVATIVE; HYDROGEN; METHYL GROUP; UNCLASSIFIED DRUG; ORGANOMETALLIC COMPOUND; RHENIUM; SELENIUM;

ARTICLE; CALCULATION; CORRELATION ANALYSIS; CRYSTAL STRUCTURE; ELECTROCHEMICAL ANALYSIS; ELECTRON SPIN RESONANCE; HIGH TEMPERATURE PROCEDURES; KAGOME TOPOLOGY; LOW TEMPERATURE PROCEDURES; MAGNETISM; MATHEMATICAL ANALYSIS; METAL BINDING; MOLECULAR DYNAMICS; MOLECULAR STABILITY; ORGANIC CHEMISTRY; QUALITATIVE ANALYSIS; ROOM TEMPERATURE; SURFACE CHARGE; CHEMICAL STRUCTURE; CHEMISTRY; CRYSTALLIZATION; ELECTRON; HYDROGEN BOND; METHODOLOGY; TEMPERATURE; X RAY CRYSTALLOGRAPHY;

CRYSTALLIZATION; CRYSTALLOGRAPHY, X-RAY; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTRONS; HYDROGEN BONDING; MODELS, MOLECULAR; ORGANOMETALLIC COMPOUNDS; RHENIUM; SELENIUM; TEMPERATURE;

EID: 24044525617     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0523385     Document Type: Article

References (65)

1. Johnston, R. L.; Hoffmann, R. Polyhedron 1990, 9, 1901.
2. Vander Griend, D. A.; Boudin, S.; Caignaert, V.; Poeppelmeier, K. R.; Wang, Y.; Dravid, V. P.; Azuina, M.; Takano, M.; Hu, Z.; Jorgensen, J. D. J. Am. Chem. Soc. 1999, 121, 4787.
3. (a) Grohol, D.; Papoutsakis, D.; Nocera, D. G. Anqew. Chem., Int. Ed. 2001, 40, 1519.
4. (b) Grohol, D.; Nocera, D. G. J. Am. Chem. Soc. 2002. 124, 2640.
5. (c) Papoutsakis, D.; Grohol, D.; Nocera, D. G. J. Am. Chem. Soc. 2002, 124, 2647.
6. (d) Nocera, D. G.; Bartlett, B. M.; Grohol, D.; Papoutsakis, D.; Shores, M. P. Chem. Eur. J. 2004, 10, 3850.
7. (a) Paul, G.; Choudhury, A.; Rao, C. N. R. Chem. Commun. 2002, 1904.
8. (b) Behera, J. N.; Paul, G.; Choudhury, A.; Rao. C. N. R. Chem. Commun. 2004, 456.
9. (a) Mila, F. Phys. Rev. Lett. 1998, 81, 2356.
10. (b) Mila, F.; Dean, D. Eur. Phys. J. B 2002, 26, 301.
11. Greedan, J. E. J. Mater. Chem. 2001, 11, 37.
12. (a) Moulton, B.; Lu, J.; Hajndl, R.; Hariharan, S.; Zaworotko, M. J. Angew. Chem., Intl. Ed. 2002, 41, 2821.
13. (b) Atwood, J. L. Nat. Mater. 2002, 1, 91.
14. (a) Awaga, K.; Inabe, T.; Nakamura, T.; Matsumoto, M.; Maruyama, Y. Chem. Phys. Lett. 1992, 195, 21.
15. (b) Awaga, K.; Okuno, T.; Yamagushi, A.; Hasegawa, M.; Inabe, T.; Maruyama, Y.; Wada, N. Phys. Rev. 1994, B49, 3975.
16. Heuzé, K.; Fourmigué, M.; Batail, P.; Canadell, E.; Auban-Senzier. P. Chem. Eur. J. 1999, 5, 2971.
17. Fourmigué, M.; Batail, P. Chem. Rev. 2004, 104, 5379.
18. Heuzé, K.; Fourmigué, M.; Batail, P. J. Mater. Chem. 1999, 9, 2373.
19. Yoshimura, T.; Ishizaka, S.; Sasaki, Y.; Kim, H.-B.; Kitamura, N.; Naumov, N. G.; Sokolov, M. N.; Fedorov, V. E. Chem. Lett. 1999, 1121.
20. Gabriel, J.-C.; Boubekeur, K.; Uriel, S.; Batail, P. Chem. Rev. 2001, 101, 2037.
21. Coronado, E.; Day, P. Chem. Rev. 2004, 104, 5419.
22. Batail, P. Chem. Rev. 2004, 104, 4887.
23. (a) Bennett, M. V.; Shores, M. P.; Beauvais, L. G.; Long, J. R. J. Am. Chem. Soc. 2000, 122, 6664.
24. (b) Naumov, N. G.; Ostanina, E. V.; Virovets, A. V.; Schmidtman, M.; Müller, A.; Fedorov, V. E. Russ. Chem. Bull. 2002, 51, 866.
25. (c) Baudron, S. A.; Deluzet, A.; Boubekeur, K.; Batail, P. Chem. Commun. 2002, 2124.
26. Batail, P.; Boubekeur, K.; Fourmigué, M.; Gabriel, J.-C. Chem. Mater. 1998, 10, 3005.
27. Stoe-1PDS Software manual V2.87, December 1997, STOE, Darmstadt, Germany.
28. Whangbo, M.-H.; Hoffmann, R. J. Am. Chem. Soc. 1978, 100, 6093.
29. Ammeter, J.; Bürgi, H.-B.; Thibeault, J.; Hoffmann, R. J. Am. Chem. Soc. 1978, 100, 3686.
30. Heuzé, K.; Fourmigué, M.; Batail; P.; Coulon, C.; Clérac, R.; Canadell, E.; Auban-Senzier, P.; Ravy, S.; Jerome, D. Adv. Mater. 2003, 15, 1251.
31. Piter, J. H.; Magno, R. Phys. Rev. B 1971, 3, 663.
32. Giamarchi, T. Chem. Rev. 2004, 104, 5037.
33. (a) Bennett, M. V.; Beauvais, L. G.; Shores, M. P.; Long, J. R. J. Am. Chem. Soc. 2001, 123, 8022.
34. (b) Larina, T. V.; Ikorskii, V. N.; Vasenin, N. T.; Anufrienko, V. F.; Naumov, N. G.; Ostanina E. V.; Fedorov, V. E. Russ. J. Coord. Chem. 2002, 28, 554. These authors find g = 2.51 at 77 K.
35. 6)]. Because of the important line width, accurate measurements are possible at low temperature only. For example, at 30 K, a nearly isotropic signal is recorded with g = 2.50 and a line width of 340 G. This temperature is probably optimum for this determination as the ESR line becomes asymmetric at lower temperature.
36. To avoid a large distortion of the line shape, this study was made with a small single crystal. We have checked that the resonance line has a larger asymmetry for bigger crystals.
37. Wzietek, P.; Mayaffre, H.; Jérome, D.; Brazovskii, S. J. Phys. I France 1996, 6, 2011.
38. Wzietek, P.; Creuzet, F.; Bourbonnais, C.; Jérome, D.; Bechgaard, K.; Batail, P. J. Phys. I France 1993, 3, 171.
39. Miyagawa, K.; Kanoda, K.; Kawamoto, A. Chem. Rev. 2004, 104, 5635.
40. Abragam, A. The Principles of Nuclear Magnetism; Clarendon Press: Oxford, 1961.
41. Hone, D. W.; Pincus, P. Phys. Rev. B 1973, 7, 4889.
42. Soda, G.; Jérome, D.; Weger, M.; Alizon, J.; Gallice, J.; Robert, H.; Fabre, J.-M.; Giral, L. J. Phys. 1977, 38, 931.
43. Boucher, J. P.; Ferrieu, F.; Nechtschein, M. Phys. Rev. B 1974, 9, 3871.
44. Borsa, F.; Mali, M. Phys. Rev. B 1974, 9, 2215.
45. Clark, W. G.; Hanson, M. E.; Alavi, B.; Moulton, W. G.; Kuhns, P.; Reyes, A. Synth. Met. 1999, 103, 2166-2167.
46. (a) Nomura, K.; Kubota, H.; Kotomizu, M.; Hanajiri, T.; Nakatsuji, S.; Yamada, J. Synth. Met. 2003, 19-21, 133-134.
47. (b) Matsunaga, N.; Hosokawa, Y.; Iwasaki, H.; Nomura, K.; Takasaki, S.; Yamada, J.; Nakatsuji, S.; Anzai, H.; Nakamura, T.; Takahashi, T.; Saito, G. J. Phys. IV 1999, 9, Pr10-243.
48. See, for example, Hamad, I. J.; Trumper, A. E.; Wzietek, P.; Lefebvre, S.; Manuel, L. O. cond-mat/0501146.
49. Carrington A.; McLachlan, A. D. Introduction to Magnetic Resonance; Harper and Row: New York, 1966.
50. Such an analysis was made, for example, for TTF-TCNQ: Tomkiewicz, Y.; Taranko, A. R.; Torrance, J. B. Phys. Rev. Lett. 1976, 36, 751.
51. See, for example, Chaikin, P. M.; Lubensky, T. C. Principles of Condensed Matter Physics; Cambridge University Press: New York, 1998.
52. Prost, J.; Barois, P. J. Chim. Phys. 1983, 80, 65.
53. Baudron, S. A.; Avarvari, N.; Batail, P.; Coulon, C.; Clérac, R.; Canadell, E.; Auban-Senaer, P. J. Am. Chem. Soc. 2003, 125, 11583.
54. Details of calculations are available in ref 42.
55. Torrance, J. B.; Tomkiewicz, Y.; Silverman, B. D. Phys. Rev. 1977, B15, 4738.
56. -3 emu/mol.
57. See ref 24 as well as (a) Seo, H.; Fukuyama, H. Synth. Met. 2003, 133-134, 257.
58. (b) Seo, H.; Hotta, C.; Fukuyama, H. Chem. Rev. 2004, 104, 5005.
59. (c) Miyagama, K.; Kawamoto, A.; Kanoda, K. Phys. Rev. 2000, B62, R7679.
60. Kanoda, K. Physica C 1997, 282-287, 299.
61. Lefebvre, S.; Wzietek, P.; Brown, S.; Bourbonnais, C.; Jérome, D.; Mézière, C.; Fourmigué, M., Batail, P. Phys. Rev. Lett 2000, 85, 5420.
62. Mori, T. Chem. Rev. 2004, 104, 4947.
63. Tulsky, E. G.; Crawford, N. R. M.; Baudron, S. A.; Batail, P.; Long, J. R. J. Am. Chem. Soc. 2003, 125, 15543.
64. Limelette, P.; Wzietek, P.; Florens, S.; Georges, A.; Costi, T. A.; Pasquier, C.; Jérome, D.; Mézière, C.; Batail. P. Phys. Rev. Lett. 2003, 91, 16401.
65. Limelette, P.; Georges, A.; Jérome, D.; Wzietek, P.; Metcalf, P.; Honig, J. M. Science 2003, 302.