Subthreshold electron mobility in SOI MOSFETs and MESFETs

IEEE Transactions on Electron Devices

Volumn 52, Issue 7, 2005, Pages 1622-1626

  Khan, Tarik ^a   Vasileska, Dragica ^a   Thornton, Trevor J ^a  

^a Arizona State University   (United States)

Author keywords

Low field mobility; Low power radio frequency applications; SOI MESFETs; Surface roughness scattering

Indexed keywords

COMPUTER SIMULATION; ELECTRON MOBILITY; MESFET DEVICES; MONTE CARLO METHODS; POISSON EQUATION; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; SURFACE ROUGHNESS;

LOW FIELD MOBILITY; LOW POWER RADIO FREQUENCY APPLICATIONS; SOI MESFETS; SURFACE ROUGHNESS SCATTERING;

MOSFET DEVICES;

EID: 23944527171     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.850617     Document Type: Article

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