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Volumn 21, Issue 4, 2005, Pages 377-389

Self-checking voter for high speed TMR systems

Author keywords

Duplication and comparison; High reliabily; Self checking; TMR systems; Voter

Indexed keywords

CMOS INTEGRATED CIRCUITS; RELIABILITY;

EID: 23944467528     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-005-0838-4     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.