A design diversity metric and analysis of redundant systems

IEEE Transactions on Computers

Volumn 51, Issue 5, 2002, Pages 498-510

  Mitra, Subhasish ^a,b   Saxena, Nirmal R ^a,b   McCluskey, Edward J ^a,b  

^a IEEE   (United States)

^b Stanford University   (United States)

Author keywords

Common mode failures; Dependability; Design diversity; Error detection; Fault tolerant computing

Indexed keywords

COMMON-MODE FAILURES; DESIGN DIVERSITY; REDUNDANT SYSTEMS;

COMPUTER SOFTWARE; ERROR DETECTION; FAULT TOLERANT COMPUTER SYSTEMS; REDUNDANCY; RELIABILITY;

SYSTEMS ANALYSIS;

EID: 0036566154     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2002.1004589     Document Type: Article

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