SCOPUS 정보 검색 플랫폼

Progress in Organic Coatings

Volumn 54, Issue 2, 2005, Pages 104-112

Migration and segregation phenomena of a silicone additive in a multilayer organic coating

(4) Hinder, Steven J a Lowe, Chris b Maxted, James T b Watts, John F a

a UNIVERSITY OF SURREY (United Kingdom)

b Becker Industrial Coatings Ltd (United Kingdom)

Author keywords

Compositional depth profiling; Multilayer organic coating; ToF SIMS; ULAM; XPS

Indexed keywords

ADDITIVES; CONCENTRATION (PROCESS); MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; SEGREGATION (METALLOGRAPHY); SILICONE COATINGS; X RAY PHOTOELECTRON SPECTROSCOPY;

COMPOSITIONAL DEPTH PROFILING; LINESCAN; SILICONE ADDITIVE; TOF-SIMS; TOPCOATS; ULAM;

ORGANIC COATINGS;

EID: 23944457313 PISSN: 03009440 EISSN: None Source Type: Journal
DOI: 10.1016/j.porgcoat.2005.04.007 Document Type: Article

Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.