Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 1032-1036

  Hinder, Steven J ^a   Watts, John F ^a   Lowe, Chris ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Becker Industrial Coatings Ltd   (United Kingdom)

Author keywords

Depth profiling; Multilayer interfaces; Polymeric coatings; Ultra low angle microtomy; X ray photoelectron spectroscopy

Indexed keywords

DEPTH PROFILING; MULTILAYER INTERFACES; POLYMERIC COATINGS; ULTRA-LOW-ANGLE MICROTOMY;

ADHESION; BONDING; DURABILITY; INTERFACES (MATERIALS); IONS; MULTILAYERS; POLYMERS; POWDER COATINGS; SUBSTRATES; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ORGANIC COATINGS;

EID: 4444361576     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1830     Document Type: Conference Paper

References (10)

1. Chen C, Wang J, Even MA, Chen Z. Macromolecules 2002; 35: 21.
2. Wang J, Wang T. Mater. Sci. Eng. B 2000; 72: 2.
3. Kugler T, Andersson A, Logdlund M, Holmes AB, Li X, Salaneck WR. Synth. Met. 1999; 100: 1.
4. Cumpson PJ. J. Electron Spectrosc. Relat. Phenom. 1995; 73: 1.
5. Perruchot C, Watts JF, Lowe C, White RG, Cumpson PJ. Surf. Interface Anal. 2002; 33: 10.
6. Ross GJ, Barradas NP, Hill MP, Jeynes C, Morrissey P, Watts JF. J. Mater. Sci. 2001; 36: 19.
7. Walls JM, Hall DD, Sykes DE. Surf. Interface Anal. 1979; 1: 6.
8. Lea C, Seah MP. Thin Solid Films 1981; 75: 1.
9. Cohen JM, Castle JE. Inst. Phys. Conf. Ser. No 93, 1988; 1: Chapter 5.
10. Guichenuy M, Watts JF, Abel ML, Brown AM, Audenaert M, Amouroux N. Surf. Interface Anal. 2004; 36: 685.