A ToF-SIMS investigation of a buried polymer/polymer interface exposed by ultra-low-angle microtomy

Surface and Interface Analysis

Volumn 36, Issue 12, 2004, Pages 1575-1581

  Hinder, Steven J ^a   Lowe, Chris ^b   Maxted, James T ^b   Watts, John F ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Becker Industrial Coatings Ltd   (United Kingdom)

Author keywords

Buried interface; Imaging SIMS; Multilayer Coatings; Time of flight secondary ion mass spectrometry; Ultra low angle microtomy

Indexed keywords

ALUMINUM; COPOLYMERS; FLUORINE CONTAINING POLYMERS; POLYAMIDES; POLYURETHANES; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ACRYLIC CO-POLYMERS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); ULTRA-LOW-ANGLE MICROTOMY (ULAM);

MULTILAYERS;

EID: 10844248198     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1985     Document Type: Article

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