The use of high-resolution XPS and ToF-SIMS to investigate segregation phenomena of minor components of a model coil coating formulation

Surface and Interface Analysis

Volumn 26, Issue 6, 1998, Pages 444-454

  Leadley, S R ^a,d   Watts, J F ^a   Blomfield, C J ^b   Lowe, C ^c  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Kratos Analytical Ltd   (United Kingdom)

^c Becker Industrial Coatings Ltd   (United Kingdom)

^d DOW CORNING LTD   (United Kingdom)

Author keywords

Adhesion; Coil coatings; Surface segregation; ToF SIMS; XPS

Indexed keywords

ADHESION; AGENTS; EPOXY RESINS; FLOW CONTROL; INTERFACES (MATERIALS); SECONDARY ION MASS SPECTROMETRY; STEEL; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

COIL COATINGS; HOT DIPPED GALVANIZED STEEL; SURFACE SEGREGATION;

ORGANIC COATINGS;

EID: 0032069822     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(19980515)26:6<444::aid-sia387>3.0.co;2-5     Document Type: Article

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