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Journal of Non-Crystalline Solids

Volumn 238, Issue 1-2, 1998, Pages 143-151

Structural investigation on implanted copper ions in silica glass by XAFS spectroscopy

(9) Fukumi, Kohei a Chayahara, Akiyoshi a Kadono, Kohei a Kageyama, Hiroyuki a Akai, Tomoko a Kitamura, Naoyuki a Makihara, Masaki a Fujii, Kanenaga a Hayakawa, Junji a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; ION IMPLANTATION; MOLECULAR STRUCTURE;

X-RAY ABSORPTION FINE STRUCTURE (XAFS) SPECTROSCOPY;

FUSED SILICA;

EID: 0032163871 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(98)00576-6 Document Type: Article

Times cited : (17)

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