ToF-SIMS analysis of surface-anchored organometallic clusters

Journal of Organometallic Chemistry

Volumn 690, Issue 16, 2005, Pages 3861-3863

  Li, Chunxiang ^a   Doreen Lai, Mei Ying ^b   Leong, Weng Kee ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

Clusters; Organometallic; Surface; ToF SIMS

Indexed keywords

CHARACTERIZATION; ELECTRODEPOSITION; GOLD; SILVER; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

CLUSTERS; SILICA SURFACE; SURFACE ORGANOMETALLIC; TOF-SIMS;

ORGANOMETALLICS;

EID: 23844485561     PISSN: 0022328X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jorganchem.2005.05.012     Document Type: Short Survey

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