Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 328-331

  Li, Z ^a   Rickman, R D ^a   Verkhoturov, S V ^a   Schweikert, E A ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Layer by layer; Polyelectrolytes; Self assembly; SIMS

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; POLYELECTROLYTES; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

LAYER-BY-LAYER; MULTI-LAYER SURFACE FILMS; SECONDARY ION SPECTRA;

ULTRATHIN FILMS;

EID: 2942534283     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.081     Document Type: Conference Paper

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