In-plane resistivity of ultrathin gold films: A high sensitivity, molecularly differentiated probe of mercaptan chemisorption at the liquid- metal interface [15]

Journal of the American Chemical Society

Volumn 120, Issue 38, 1998, Pages 9969-9970

  Zhang, Y ^a   Terrill, R H ^a   Bohn, P W ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALCOHOL; GOLD; THIOL DERIVATIVE;

ACCURACY; ADSORPTION; ELECTRIC RESISTANCE; ELECTRON; FILM; LETTER; MEASUREMENT; SIGNAL NOISE RATIO;

EID: 0032582059     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja980926v     Document Type: Letter

References (58)

1. Mott, N. F.; Jones, H. The Theory of the Properties of Metals and Alloys’, Dover: New York, 1936; p 268.
2. Nuzzo, R. G.; Allara D. L. J. Am. Chem. Soc. 1983, 105, 4481-4483.
3. Bain, C. D.; Troughton, B. E.; Tao, Y. T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am Chem. Soc. 1989, III, 321-335.
4. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am Chem. Soc. 1987, 109, 3559-3568.
5. Kumar A.; Biebuyck, H. A.; Abbott, N. L.; Whitesides, G. M. J. Am. Chem. Soc. 1992, 114. 9188-9189.
6. Kumar, A.; Biebuyck, H. A.; Whitesides G. M. Langmuir 1994. 10. 1498-1511.
7. Kumar, A.; Whitesides, G. M. Science 1994 263, 60-62.
8. Wilbur, J. L.; Kim, E.; Xia, Y.; Whitesides, G. M. Adi’. Mater. 1995, 7, 649-652.
9. Xia, Y.; Whitesides, G. M. J. Am. Chem. Soc. 1995,117, 3274-3275.
10. Li, Y.; Huang, J.; Mclver, R. T.; Hemminger, J. C. J. Am. Chem. Soc. 1992, 114, 2428-2432.
11. Huang, J.; Hemminger, J. C. J. Am. Chem. Soc. 1993, 115, 3342-3343.
12. Tarlov, M. J.; Burgess, D. R. F.; Gillen, G. J. Am. Chem. Soc. 1993, 115, 5305-5306.
13. Huang, J.; Dahlgren, D. A.; Hemminger, J. C. Langmuir 1994, 10, 626-628.
14. Gillen, G.; Bennett, J.; Tarlov, M. J.; Burgess, D. R. F. Anal. Chem. 1994, 66, 2170-2174.
15. Chan, K. C.; Kim, T.; Schoer, J. K.; Crooks, R. M. J. Am. Chem. Soc. 1995, 117, 5875-5876.
16. Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y. T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152-7167.
17. Parikh A. N.; Allara, D. L. J. Chem. Pins. 1992. 2. 927-945.
18. Terrill, R. H.; Tänzer, T. A.; Bohn, P. W. Langmuir 1998, 14. 845-854.
19. Peterlinz, K. A.; Georgiadis, R. Langmuir 1996, 12, 4731-4740.
20. Zhang, Y.; Terrill, R. H.; Tänzer, T. A.; Bohn, P. W. J. Am. Chem. Soc. 1998, 120. 2654-2655.
21. Folkers, J. P.; Laibinis, P. E.; Whitesides, G. M. Langmuir 1992, 8, 1330-1341.
22. Kim, Y. T.; McCarley, R. L.; Bard, A. J. Langmuir 1993, 9, 1941-1944.
23. Yamada, R.; Uosaki. K. Langmuir 1998, 14, 855-861.
24. Nelles G., Schonherr, H.; Jaschke, M.; Wolf, H.; Schaub, M.; Kuther, J.: Trcmel, W.; Bamberg, E.; Ringsdorf, H.; Butt, H. J. Langmuir 1998, 14, 808-815.
25. Weisshaar, D. E.; Lamp B D.; Porter, M. D. J. Am. Chem. Soc. 1992, 114, 5860-5862.
26. Walczak, M. M.; Popcnoe, D. D.; Deinhammer, R. S.; Lamp B. D.; Chung, C.; Porter, M. D. Langmuir 1991, 11, 2687-2693.
27. Widrig, C. A.; Chung, C.; Porter, M. D. J. Electroanal. Chem. 1991, 310, 335-359.
28. Sabatani, E.; Rubinstein, I. J. Pliys. Chem. 1987, 91,6663-6669.
29. Sabatani, E.; Boulakia, J. C.; Bruening, M.; Rubinstein, L. Langmuir 1993, 9, 2974-2981.
30. Thomas R. C.; Sun, L.; Crooks, R. M.: Riceo A. J. Langmuir 1991, 7, 620-622.
31. Sun, L.; Thomas, R. C.; Crooks, R. M.; Ricco, A. J. J. Am. Chem. Soc. 1991, 113. 8550-8552.
32. Schlenoff, J. B.; Li, M.; Ly H. J. Am. Chem. Soc. 1995, 117, 12528-12536.
33. Fuchs, K. Proc. Cambridge Philos. Soc. 1938, 34, 100.
34. Dayal, D.; Finzel, H. U.; Wissmann, P. In Thin Metal Films and Gas Chemisorption, Wissmann, P., Ed.; Elsevier: Amsterdam, 1987, and References therein, Wissmann, P. In Surface Physics. Springer Tracts in Modem Physics; Hohler, G., Ed.; Springer: New York, 1975; Vol. 77.
35. Rauh, M.; Heping, B.; Wissmann, P. Appl. Phys. A 1995, 61, 587.
36. Krastev, E. T.; Kuhl, D E.; Tobin, R. G. Surf. Sci. 1997, 387, L1051-L1056.
37. Finzel, H. U.; Heping, B.; Wissmann, P. Z Naturforsch. 1997, 52A. 640-644.
38. Hein, M.; Schumacher, D. J. Phys. D: Appl. Phys. 1995, 28, 1937-1941.
39. Cabrera, A. L.; Carrido-Molina, W.; Colino, J.; Lederman, D.; Schuller, I. K. Phys. Rev. B 1997, 55, 13999-14004.
40. McNemey, J. J.; Buseck, P. R.; Hanson, R. C. Science 1972, 178, 611-612.
41. Tanner, B. Introduction to the Physics of Electrons In Solids’, Cambridge University Press: Cambridge, 1995; p 37.
42. Hanewinkel, C.; Winkes, H.; Schumacher, D.; Otto, A. Electrochim. Acta 1997, 20, 3345-3349.
43. Rath, D. L.; Hansen, W. N. Surf. Sci. 1984. 136, 195-216.
44. Hansen, W. N. Surf. Sci. 1980. 101, 109-122.
45. Kretschmann, E.; Raether, H. Z. Naturforsch. 1968, 23, 2135.
46. 4b
47. 4 (Piranha) solution (Caution: Piranha solution should be handled carefully) for about 20 min, followed by rinsing in water (milli-Q UV-plus, 18.2 MΩ) and ethanol.
48. 16Fc, at least up to 0.65 ML, (2) SPR resonance shift is linear with coverage, determined similarly, at least up to 0.65 ML, (3) SPR resonance shift is linear with coverage, as determined by infrared absorption for 4-mercaptobenzoic acid, over the full submonolayer to monolayer coverage range. The linearity of the SPR resonance shift with coverage has also been observed in Sigal, G. B.; Mrksich, M.; Whitesides, G. M. Langmuir 1997. 13. 2749-2755.
49. Peterlinz, K. A.; Georgiadis, R. Langmuir 1996, 12, 4731-4740.
50. Nuzzo, R. G.; Fusco, F. A.; Allara, D. L. J. Am. Chem. SQC. 1987, 109, 2358-2368.
51. Zelenay, P.; Rice-Jackson, L. M.; Wieckowski, A. Langmuir 1990, 6, 974-979.
52. 2 resulted in a reproducible transient reduction in resistivity due to the heat of vaporization of the adsorbed ethanol layer.
53. Krysinski, P.; Chamberlain, R. V.; Majda, M. Langmuir 1994, 11, 4286-4294.
54. -3.
55. Kittel, C. Introduction to Solid Stale Physics, 5th ed.; John Wiley: New York, 1976: p 154.
56. Persson, B. N. J.; Schumacher, D.; Otto, A. Chem. Phys. Leu. 1991, 178, 204-212.
57. Persson, B. N. J. J. Chem. Phys. 1993, 98, 1659-1672.
58. -adsorption-induced Δp/p0.