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2342484655
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note
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2+/Cu°, 0.1 s at -0.80 V, 1200 s at -0.005 V.
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15
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2342571855
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note
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The intercepts on the resistance axis of the plots shown in Figure 3D provide an estimate of the average contact resistance. The contact resistance fluctuated widely in our measurements as is apparent for the two data sets shown in Figure 3D, but although it is much higher for trace "x" than for trace "y" in Figure 3D, it was uncorrelated with the slope of these plots in general. We attribute these fluctuations, and the noise observed in data itself, to the irreproducibility of the contact resistance between the tip and the surface of the nanowire. The degree of irreproducibility, and the amount of noise, varied from tip to tip and seemed therefore to be a function of the particular tip that was used in the measurement.
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22
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2342577715
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note
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2O at interparticle boundaries.
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