Reversible transport characteristics of multi-walled carbon nanotubes in free space

Nanotechnology

Volumn 16, Issue 9, 2005, Pages 1707-1711

  Gupta, Rishi ^a,b   Stallcup II, Richard E ^a   In Het Panhuis, Marc ^b,c  

^a ZYVEX CORPORATION   (United States)

^b UNIVERSITY OF TEXAS AT DALLAS   (United States)

^c UNIVERSITY OF HULL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SURFACE PROPERTIES; TENSILE STRENGTH; TRANSPORT PROPERTIES;

ELECTRICAL PROBING SYSTEM; MULTI-WALLED CARBON NANOTUBES; NANO-MANIPULATION SYSTEM; TRANSPORT CHARACTERISTICS;

CARBON NANOTUBES;

EID: 23444458381     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/9/050     Document Type: Article

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