Digital phase-shifting atomic force microscope Moiré method

Journal of Physics D: Applied Physics

Volumn 38, Issue 8, 2005, Pages 1182-1189

  Liu, Chia Ming ^a   Chen, Lien Wen ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; PHASE SHIFT; SIGNAL INTERFERENCE; STRAIN; WAVELET TRANSFORMS;

MICROSCALE MEASUREMENT; PHASE-SHIFTING TECHNOLOGY; SPECIMEN GRATING; STRAIN FIELDS;

ATOMIC FORCE MICROSCOPY;

EID: 23444440259     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/8/014     Document Type: Article

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