In-plane deformation measurement using the atomic force microscope moire method

Nanotechnology

Volumn 11, Issue 1, 2000, Pages 24-29

  Xie, Huimin ^a   Kishimoto, Satoshi ^b   Asundi, Anand ^a   Boay, Chai Gin ^a   Shinya, Norio ^b   Yu, Jin ^a   Ngoi, Bryan K A ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; DEFORMATION; DIFFRACTION GRATINGS; GRAPHITE; LASER BEAM EFFECTS; MICA; MOIRE FRINGES; RESIDUAL STRESSES; STRAIN; STRESS ANALYSIS; SURFACE STRUCTURE;

DEFORMATION MEASUREMENT; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); SCANNING MOIRE METHOD;

ATOMIC FORCE MICROSCOPY;

EID: 0033880190     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/11/1/305     Document Type: Article

References (13)

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