Experimental Investigation of the Contact Mechanics of Rough Fractal Surfaces

IEEE Transactions on Nanobioscience

Volumn 3, Issue 1, 2004, Pages 27-31

  Buzio, R ^a   Malyska, K ^b   Rymuza, Z ^b   Boragno, C ^c   Biscarini, F ^c   De Mongeot, F Buatier ^c   Valbusa, U ^c  

^a INFM   (Italy)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c CNR   (Italy)

Author keywords

Atomic force microscopy; Carbon; Contact mechanics; Fractals; Indentation; Sexithienyl; Srtio3

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; COATINGS; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; FRACTALS; INDENTATION; INTERFACES (MATERIALS); MATERIALS SCIENCE; MORPHOLOGY; SOLIDIFICATION; SURFACE ROUGHNESS; THIN FILMS;

CONTACT MECHANICS; FRACTAL GEOMETRY; LOAD-DISPLACEMENT CURVES; SEXITHIENYL; SRTIO3;

BIOMECHANICS;

CARBON; OXIDE; STRONTIUM; STRONTIUM TITANIUM OXIDE; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FRACTAL ANALYSIS; MATERIALS TESTING; MECHANICS; METHODOLOGY; NANOTECHNOLOGY; SURFACE PROPERTY;

CARBON; FRACTALS; MATERIALS TESTING; MECHANICS; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; OXIDES; STRONTIUM; SURFACE PROPERTIES; TITANIUM;

EID: 2342646854     PISSN: 15361241     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNB.2003.820264     Document Type: Article

References (18)

1. W. C. Oliver and G. M. Pharr, "An improved technique for determining the hardness and elastic modulus using load and displacement sensing indentation experiments," J. Mater. Res., vol. 7, pp. 1564-1583, 1992.
2. X. Li and B. Bhushan, "A review of nanoindentation continuous stiffness measurement technique and its applications," Mater. Characterizat., vol. 48, pp. 11-36, 2002.
3. B. Bhushan, A. V. Kulkarni, W. Bonin, and J. T. Wyrobek, "Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy," Philos. Mag., vol. 74, pp. 1117-1128, 1996.
4. L. He and J. Zhu, "The fractal character of processed metal surfaces," Wear, vol. 208, pp. 17-24, 1997.
5. L. Barabasi and J. Stanley, Fractal Concepts in Surface Growth. Cambridge, U.K.: Cambridge Univ. Press, 1995.
6. R. Buzio, E. Gnecco, C. Boragno, U. Valbusa, E. Barborini, P. Piseri, and P. Milani, "Self-affine properties of cluster-assembled carbon thin films," Surf. Sci., vol. 444, pp. L1-L6, 2000.
7. M. S. Bobji, S. K. Biswas, and J. B. Pethica, "Effect of roughness on the measurement of nanohardness-a computer simulation study," Appl. Phys. Lett., vol. 71, pp. 1059-1061, 1997.
8. B. B. Mandelbrot, D. E. Passoja, and A. J. Paulley, "Fractal character of fracture surfaces of metals," Nature, vol. 308, pp. 721-722, 1984.
9. F. F. Ling, "Scaling law for contoured length of engineering surfaces," J. Appl. Phys., vol. 62, pp. 2570-2572, 1987.
10. L. Pietronero and E. Tosatti, Eds., Fractals in Physics. Amsterdam, The Netherlands: North-Holland, 1986.
11. R. Buzio, F. Bautier de Mongeot, C. Boragno, and U. Valbusa, "A novel approach for the investigation of mesoscopic contact mechanics," Thin Solid Films, vol. 428, pp. 111-114, 2003.
12. R. Buzio, C. Boragno, F. Biscarini, F. Bautier de Mongeot, and U. Valbusa, "The contact mechanics of fractal surfaces," Nature Mater., vol. 2, pp. 232-236, 2003.
13. A. L. Weisenhorn, M. Khorsandi, S. Kasas, V. Gotzos, and H. J. Butt, "Deformation and height anomaly of soft surfaces studied with an AFM," Nanotechnology, vol. 4, pp. 106-113, 1993.
14. F. Biscarini, P. Samori, O. Greco, and R. Zamboni, "Scaling behavior of anisotropic organic thin films grown in high vacuum," Phys. Rev. Lett., vol. 78, pp. 2389-2392, 1997.
15. 3 crystal surface," Science, vol. 266, pp. 1540-1542, 1994.
16. W. Yan and K. Komvopoulos, "Contact analysis of elastic-plastic fractal surfaces," J. Appl. Phys., vol. 84, pp. 3617-3624, 1997.
17. S. Suresh, T. G. Nieh, and B. W. Choi, "Nano-indentalion of copper thin films on silicon substrates," Scripta Materialia, vol. 41, pp. 951-957, 1999.
18. B. N. J. Persson, "On the mechanism of adhesion in biological systems," J. Chem. Phys., vol. 118, pp. 7614-7621, 2003.