A novel approach for the investigation of mesoscopic contact mechanics

Thin Solid Films

Volumn 428, Issue 1-2, 2003, Pages 111-114

  Buzio, R ^a   Buatier de Mongeot, F ^a   Boragno, C ^a   Valbusa, U ^a  

^a INFM   (Italy)

Author keywords

Atomic force microscopy; Carbon; Clusters; Contact mechanics

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTALS; LOAD TESTING; NANOSTRUCTURED MATERIALS; SURFACE TESTING;

CONTACT MECHANICS;

SURFACE PHENOMENA;

EID: 0037457162     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01231-2     Document Type: Conference Paper

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