Approach curve method for large anode-cathode distances

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 2, 2004, Pages 715-720

  Mammana, V P ^a   Monteiro, O R ^b   Fonseca, L R C ^c  

^a INTERNATIONAL TECHNOLOGY CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CAPACITORS; CARBON NANOTUBES; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTROSTATICS; FIELD EMISSION CATHODES; SURFACE ROUGHNESS; VACUUM;

APPROACH CURVE METHOD (ACM); BALLAST RESISTORS; ELECTROSTATIC DISTURBANCE; SINGLE WALL CARBON NANOTUBES (SWNT);

FIELD EMISSION DISPLAYS;

EID: 2342527186     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1651547     Document Type: Article

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