메뉴 건너뛰기




Volumn 17, Issue , 2004, Pages 381-389

A 800 MHz system-on-chip for wireless infrastructure applications

Author keywords

[No Author keywords available]

Indexed keywords

CPU; FORWARD ERROR CORRECTION (FEC) ALGORITHM; PROGRAMMABLE HARDWARE COPROCESSORS; SYSTEM-ON-CHIP (SOS);

EID: 2342519356     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 1
  • 3
    • 0033711557 scopus 로고    scopus 로고
    • A multi-level memory system architecture for high performance DSP applications
    • Oct.
    • S. Agarwala, C. Fuoco, T. Anderson, D. Comisky, C. Mobley, "A Multi-Level Memory System Architecture for High Performance DSP Applications", in Proc. ICCD, Oct. 2000
    • (2000) Proc. ICCD
    • Agarwala, S.1    Fuoco, C.2    Anderson, T.3    Comisky, D.4    Mobley, C.5
  • 4
    • 0033710719 scopus 로고    scopus 로고
    • A scalable high performance DMA architecture for DSP applications
    • Oct
    • D. Comisky, S. Agarwala, C. Fuoco, "A Scalable High Performance DMA Architecture for DSP Applications", in Proc. ICCD, Oct 2000.
    • (2000) Proc. ICCD
    • Comisky, D.1    Agarwala, S.2    Fuoco, C.3
  • 6
  • 7
  • 8
    • 0026890885 scopus 로고
    • Circuit models for three-dimensional geometries including dielectrics
    • July
    • Albet E. Ruehli and Hansredi Heeb, "Circuit Models for Three-Dimensional Geometries Including Dielectrics", IEEE Trans. Microwave Theory Tech., vol. 40, No 7, pp 1507 - 1516, July 1992
    • (1992) IEEE Trans. Microwave Theory Tech. , vol.40 , Issue.7 , pp. 1507-1516
    • Ruehli, A.E.1    Heeb, H.2
  • 9
    • 33646864552 scopus 로고    scopus 로고
    • Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
    • Feb.
    • Roy, K.; Mukhopadhyay, S.; Mahmoodi-Meimand, H.; "Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits", in Proc. of the IEEE , Volume: 91 Issue: 2 , Feb. 2003
    • (2003) Proc. of the IEEE , vol.91 , Issue.2
    • Roy, K.1    Mukhopadhyay, S.2    Mahmoodi-Meimand, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.