Impact of single-event upsets in deep-submicron silicon technology

MRS Bulletin

Volumn 28, Issue 2, 2003, Pages 117-120

  Baumann, Robert ^a  

^a NONE

Author keywords

Radiation; Semiconductors; Single event upsets; Soft errors

Indexed keywords

ALPHA PARTICLES; BIPOLAR TRANSISTORS; ELECTRIC FIELD EFFECTS; ELECTRONICS PACKAGING; ERRORS; NEUTRONS; RADIATION EFFECTS; RELIABILITY; SEMICONDUCTOR DOPING;

DEEP SUBMICRON SILICON TECHNOLOGY; RADIATION INDUCED CHARGES; SINGLE EVENT UPSETS; SOFT ERROR SENSITIVITY;

SEMICONDUCTING SILICON;

EID: 0037292256     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2003.38     Document Type: Article

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