Forward voltage drop degradation in diffused SiC p-i-n diodes

Journal of Applied Physics

Volumn 95, Issue 8, 2004, Pages 4376-4380

  Soloviev, S ^a   Cherednichenko, D ^a   Gao, Y ^b   Grekov, A ^a   Ma, Y ^a   Sudarshan, T S ^a  

^a University of South Carolina   (United States)

^b Bandgap Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED COUPLED DEVICE CAMERA; CONTACT RESISTANCE; SHOCKLEY PARTIAL DISLOCATIONS; VOLTAGE DROP;

CAMERAS; CHARGE COUPLED DEVICES; CRYSTAL GROWTH; CURRENT DENSITY; DEGRADATION; ELECTROLUMINESCENCE; MATRIX ALGEBRA; PHONONS; POISSON EQUATION; RESIDUAL STRESSES; SEMICONDUCTOR DOPING; SILICON CARBIDE; STACKING FAULTS; TEMPERATURE; TENSORS; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTOR DIODES;

EID: 2342503338     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1687035     Document Type: Article

References (19)

1. H. Lendemann, F. Dahlquist, N. Johansson, R. Soderholm, P. A. Nilsson, J. P. Bergman, and P. Skytt, Mater. Sci. Forum 353, 727 (2001).
2. J. P. Bergman, H. Lendemann, P. A. Nilsson, U. Lindefelt, and P. Skytt, Mater. Sci. Forum 353, 299 (2001).
3. A. Galeckas, J. Linnros, and D. Breitholtz, J. Appl. Phys. 90, 980 (2001).
4. R. E. Stahlbush, M. Fatemi, J. B. Fedison, S. D. Arthur, L. B. Rowland, and S. Wang, J. Electron. Mater. 31, 827 (2002).
5. J. Q. Liu, M. Skowronski, C. Hallin, R. Soderholm, and H. Lendemann, Appl. Phys. Lett. 80, 749 (2001).
6. M. E. Twigg, R. E. Stahlbush, M. Fatemi, S. D. Arthur, J. B. Fedison, J. B. Tucker, and S. Wang, Appl. Phys. Lett. 82, 2410 (2003).
7. Y. Gao, S. Soloviev, C. C. Tin, and T. S. Sudarshan, J. Appl. Phys. 90, 5647 (2001).
8. S. Soloviev, Y. Gao, X. Wang, and T. S. Sudarshan, J. Electron. Mater. 30, 224 (2001).
9. M. S. Miao, S. Limpijumnong, and W. R. L. Lambrecht, Appl. Phys. Lett. 79, 4360 (2001).
10. A. O. Konstantinov and H. Bleichner, Appl. Phys. Lett. 71, 3700 (1997).
11. S. G. Sridhara, F. H. C. Carlsson, J. P. Bergman, and E. Janzen, Appl. Phys. Lett. 79, 3944 (2001).
12. A. Galeckas, J. Linnros, and P. Pirouz, Appl. Phys. Lett. 81, 883 (2002).
13. K. Maeda, K. Suzuki, S. Fujita, M. Ichichara, and S. Hyodo, Philos. Mag. A 57, 573 (1988).
14. S. Prussin, J. Appl. Phys. 32, 1876 (1961).
15. S. Fujita, K. Maeda, and S. Hyodo, Philos. Mag. A 55, 203 (1987).
16. P. Pirouz, J. L. Demenet, and M. H. Hong, Philos. Mag. A 81, 1207 (2001).
17. H. Sumi, Phys. Rev. B 29, 4616 (1984).
18. D. I. Cherednichenko, Y. I. Khlebnikov, I. I. Khlebnikov, R. V. Drachev, and T. S. Sudarshan, J. Appl. Phys. 89, 4139 (2001).
19. H. G. Van Bueren, Imperfections in Crystals (Interscience, New York, 1960).