A delay metric for RC circuits based on the weibull distribution

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2002, Pages 620-624

  Liu, Frank ^a   Kashyap, Chandramouli ^a   Alpert, Charles J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DELAYS; CIRCUIT FLOORPLANNING; CIRCUIT MOMENTS; CIRCUIT ROUTING;

ALGORITHMS; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT LAYOUT; INTERCONNECTION NETWORKS; LAPLACE TRANSFORMS; OPTIMIZATION; PROBABILITY DENSITY FUNCTION; TABLE LOOKUP; WEIBULL DISTRIBUTION;

ELECTRIC NETWORK ANALYSIS;

EID: 0036907238     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/774572.774664     Document Type: Conference Paper

References (14)

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