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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 5 B, 2005, Pages 3350-3352

Readout power dependence of signal distribution observed in Fourier plane of focus spot

(5) Nakano, Takashi a Mashimo, Emi a Shima, Takayuki a Yamakawa, Yuzo a Tominaga, Junji a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

Phase change; Super RENS; Super resolution

Indexed keywords

COMPUTER SIMULATION; FERROELECTRIC MATERIALS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PLATINUM COMPOUNDS; SIGNAL PROCESSING; TRANSMISSION ELECTRON MICROSCOPY; VIDEODISKS;

CARRIER-TO-NOISE RATIO (CNR); PHASE CHANGE; SIGNAL DISTRIBUTION; SUPER RESOLUTION; SUPER-RENS;

READOUT SYSTEMS;

EID: 23144431514 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.3350 Document Type: Conference Paper

Times cited : (4)

References (14)

1
- 0032511672
- J. Tominaga, T. Nakano and N. Atoda: Appl. Phys. Lett. 73 (1998) 2078.
- (1998) Appl. Phys. Lett. , vol.73 , pp. 2078
- Tominaga, J.¹ Nakano, T.² Atoda, N.³

2
- 0033889540
- H. Fuji, J. Tominaga, L. Men, T. Nakano, H. Katayama and N. Atoda: Jpn. J. Appl. Phys. 39 (2000) 980.
- (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 980
- Fuji, H.¹ Tominaga, J.² Men, L.³ Nakano, T.⁴ Katayama, H.⁵ Atoda, N.⁶

3
- 0037449276
- T. Kikukawa, T. Nakano, T. Shima and J. Tominaga: Appl. Phys. Lett. 81 (2002) 4697.
- (2002) Appl. Phys. Lett. , vol.81 , pp. 4697
- Kikukawa, T.¹ Nakano, T.² Shima, T.³ Tominaga, J.⁴

4
- 0141493537
- J. Kim, I. Hwang, D. Yoon, I. Park, D. Shin, T. Kikukawa, T. Shima and J. Tominaga: Appl. Phys. Lett. 83 (2003) 1701.
- (2003) Appl. Phys. Lett. , vol.83 , pp. 1701
- Kim, J.¹ Hwang, I.² Yoon, D.³ Park, I.⁴ Shin, D.⁵ Kikukawa, T.⁶ Shima, T.⁷ Tominaga, J.⁸

5
- 10044222267
- J. Kim, I. Hwang, H. Kim, D. Yoon, H. Park, K. Jung, I. Park and J. Tominaga: Proc. SPIE 5380 (2004) 336.
- (2004) Proc. SPIE , vol.5380 , pp. 336
- Kim, J.¹ Hwang, I.² Kim, H.³ Yoon, D.⁴ Park, H.⁵ Jung, K.⁶ Park, I.⁷ Tominaga, J.⁸

6
- 84899818694
- T. Kikukawa, N. Fukuzawa and T. Kobayashi: ISOM2004 Tech. Dig. (2004) p. 262.
- (2004) ISOM2004 Tech. Dig. , pp. 262
- Kikukawa, T.¹ Fukuzawa, N.² Kobayashi, T.³

7
- 1842759616
- T. Shima, M. Kuwahara, T. Fukaya, T. Nakano and J. Tominaga: Jpn. J. Appl. Phys. 43 (2004) L88.
- (2004) Jpn. J. Appl. Phys. , vol.43
- Shima, T.¹ Kuwahara, M.² Fukaya, T.³ Nakano, T.⁴ Tominaga, J.⁵

8
- 1842759746
- M. Kuwahara, T. Shima, A. Kolobov and J. Tominaga: Jpn. J. Appl. Phys. 43 (2004) L8.
- (2004) Jpn. J. Appl. Phys. , vol.43
- Kuwahara, M.¹ Shima, T.² Kolobov, A.³ Tominaga, J.⁴

9
- 2642530247
- J. Tominaga, T. Shima, M. Kuwahara, T. Fukaya, A. Kolobov and T. Nakano: Nanotechnology 15 (2004) 411.
- (2004) Nanotechnology , vol.15 , pp. 411
- Tominaga, J.¹ Shima, T.² Kuwahara, M.³ Fukaya, T.⁴ Kolobov, A.⁵ Nakano, T.⁶

10
- 10044281931
- T. Nakano, T. Shima and J. Tominaga: Proc. SPIE 5380 (2004) 328.
- (2004) Proc. SPIE , vol.5380 , pp. 328
- Nakano, T.¹ Shima, T.² Tominaga, J.³

11
- 0026404651
- A. Fukumoto, K. Aratani, S. Yoshimura, T. Udagawa, M. Ohta and M. Kaneko: Proc. SPIE 1499 (1991) 216.
- (1991) Proc. SPIE , vol.1499 , pp. 216
- Fukumoto, A.¹ Aratani, K.² Yoshimura, S.³ Udagawa, T.⁴ Ohta, M.⁵ Kaneko, M.⁶

12
- 0026818638
- A. Fukumoto and S. Kubota: Jpn. J. Appl. Phys. 31 (1992) 529.
- (1992) Jpn. J. Appl. Phys. , vol.31 , pp. 529
- Fukumoto, A.¹ Kubota, S.²

13
- 0027697277
- K. Yasuda, M. Ono, K. Aratani, A. Fukumoto and M. Kaneko: Jpn. J. Appl. Phys. 32 (1993) 5210.
- (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 5210
- Yasuda, K.¹ Ono, M.² Aratani, K.³ Fukumoto, A.⁴ Kaneko, M.⁵

14
- 0000045765
- J. R. Liu, P. Y. Liu, N. Y. Tang and H. D. Shieh: Appl. Opt. 37 (1998) 8187.
- (1998) Appl. Opt. , vol.37 , pp. 8187
- Liu, J.R.¹ Liu, P.Y.² Tang, N.Y.³ Shieh, H.D.⁴

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