Readout process analysis of super-RENS disk

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5380, Issue , 2004, Pages 328-335

  Nakano, Takashi ^a   Shima, Takayuki ^a   Tominaga, Junji ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Polarization; Super RENS; Super resolution; Thermal

Indexed keywords

READOUT PROCESS; SUPER-RESOLUTION; SUPER-RESOLUTION NEAR-FIELD STRUCTURE (RENS); THERMAL;

LASER BEAMS; LIGHT POLARIZATION; LIGHT SCATTERING; MAGNETOELECTRIC EFFECTS; NANOSTRUCTURED MATERIALS; SIGNAL DETECTION;

READOUT SYSTEMS;

EID: 10044281931     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557013     Document Type: Conference Paper

References (12)

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