Laser diode COFD analysis by thermoreflectance microscopy

Microelectronics Reliability

Volumn 41, Issue 9-10, 2001, Pages 1597-1601

  Dilhaire, Stefan ^a   Grauby, Stéphane ^a   Jorez, Sébastien ^a   Lopez, Luis David Patino ^a   Schaub, Emmanuel ^a   Claeys, Wilfrid ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; LIGHT ABSORPTION; SURFACE PHENOMENA;

CATASTROPHIC OPTICAL FACET DAMAGE (COFD); THERMOREFLECTANCE MICROSCOPY;

SEMICONDUCTOR LASERS;

EID: 0035456712     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00196-2     Document Type: Article

References (4)

1. th Therminic Workshop, Budapest, 24-27 Sept. 2000.
2. V. Quintard, S. Dilhaire , C. Rauzan, T. Phan and W. Claeys. Measurement of absolute temperatures upon metallic lines under current stress by laser probing. IEEE Transactions on Instrumentation and Measurement, Vol 48, N° 01, p 69, 1999.
3. W. Claeys, S. Dilhaire, and E. Schaub. Laser probing techniques and methods for the thermal characterisation of microelectronic components. Thermal Management of Electronic Systems, J.-P. Bardon, E. Beyne, J.-B. Saulnier Editors. ELSEVIER Paris, pp227-237, 1998. ISBN2-84299-033-1.
4. E. Schaub, S. Dilhaire, S. Jorez, L-D Patino Lopez and W Claeys. Calibration procedure of temperature measurements by thermoreflectance upon microelectronic devices. International Conference on Photoacoustic and Photothermal Phenomena, Kyoto, 25-29 June 2000.