Evaluation of the quality of Permalloy gratings by diffracted magneto-optical spectroscopy

Optics Express

Volumn 13, Issue 12, 2005, Pages 4651-4656

  Antos, Roman ^a   Mistrik, Jan ^a   Yamaguchi, Tomuo ^a   Visnovsky, Stefan ^b   Demokritov, Sergej O ^c   Hillebrands, Burkard ^c  

^a SHIZUOKA UNIVERSITY   (Japan)

^b CHARLES UNIVERSITY   (Czech Republic)

^c France   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC WAVE DIFFRACTION; MAGNETIC FILMS; MAGNETIC RESONANCE SPECTROSCOPY; MAGNETIZATION; MONITORING; NANOSTRUCTURED MATERIALS; OPTICAL KERR EFFECT; SCANNING ELECTRON MICROSCOPY; WAVE EFFECTS; WAVEGUIDE COUPLERS; WIRE;

MAGNETO-OPTICAL KERR EFFECT (MOKE) SPECTROSCOPY; MAGNETO-OPTICAL SPECTROSCOPY; PERMALLOY WIRES; PERMALLOYS;

DIFFRACTION GRATINGS;

EID: 22844449547     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.004651     Document Type: Article

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